Electronic circuit design

Results: 999



#Item
771MOSFET / Technology / Flicker noise / Field-effect transistor / Threshold voltage / Transistor / Electronic design / Channel length modulation / Electrical engineering / Electromagnetism / Noise

ADVANCED COMPACT MOSFET (ACM) MODEL Self-Consistent DC, AC, Noise and Mismatch MOSFET Models for Circuit Design. Carlos Galup-Montoro

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Source URL: www.nsti.org

Language: English - Date: 2010-03-19 15:35:59
772Integrated circuits / Semiconductor devices / Electronic design / Transistor / MOSFET / CMOS / NQS / Substrate coupling / Field-effect transistor / Electronic engineering / Electronics / Electrical engineering

1 Swiss Center for Electronics and Microtechnology MOS Transistor Modeling for RF Integrated Circuit Design

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Source URL: www.nsti.org

Language: English - Date: 2010-03-19 15:21:27
773Electronic design / Electromagnetism / Logic families / MOSFET / CMOS / Transistor / IC power supply pin / Integrated circuit design / Electronic engineering / Integrated circuits / Electronics

A Study of Figures of Merit for High Frequency Behavior of MOSFETs in RF IC Applications Yuhua Cheng Siliconlinx, Inc.

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Source URL: www.nsti.org

Language: English - Date: 2005-05-23 13:19:05
774Electronic design automation / Electronic circuits / Analog circuits / Electronic design / LTspice / SPICE / Capacitor / Electronic circuit simulation / Circuit diagram / Electronic engineering / Electromagnetism / Electronics

DERBY AND DISTRICT AMATEUR RADIO SOCIETY Incorporating Derby Wireless Club[removed]EVENTS RECENT AND FUTURE

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Source URL: www.dadars.org.uk

Language: English - Date: 2013-09-09 07:26:34
775Electronic design automation / Berkeley Design Automation / Electronic design / Altos Design Automation / Integrated circuit design / SPICE / Electronic circuit simulation / Application-specific integrated circuit / Simucad / Electronic engineering / Electronics / Integrated circuits

Microsoft Word - BDA PressRel_Altos_April5_2011.doc

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Source URL: www.altos-da.com

Language: English - Date: 2011-04-05 14:09:38
776Display technology / Office equipment / EBeam / Maskless lithography / Advantest / Application-specific integrated circuit / Electron beam lithography / Electronic design automation / Semiconductor Equipment and Materials International / Technology / Electronic engineering / Electronics

DRAFT MESSAGES FOR PRESS RELEASE OF LAUNCH:

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Source URL: www.ebeam.org

Language: English - Date: 2009-02-21 20:33:38
777Computer memory / Formal methods / Electronic design / Altos Design Automation / Static timing analysis / Integrated circuit design / Signoff / CPU cache / Random-access memory / Electronic engineering / Electronic design automation / Digital electronics

Technical White Paper High-Performance, High-Precision Memory Characterization Federico Politi, Altos Design Automation, Inc. High-Performance, High-Precision Memory Characterization

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Source URL: www.altos-da.com

Language: English - Date: 2009-07-14 19:10:38
778Altos Design Automation / Mentor Graphics / Synopsys / Static timing analysis / Verilog / Electronic circuit simulation / SPICE / Electric / Cadence Design Systems / Electronic engineering / Electronic design automation / Software

Liberate LV Improve your view… Liberate LV provides a collection of utilities for validating libraries including functional equivalence checking, data consistency checking, revision analysis and correlation with variou

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Source URL: www.altos-da.com

Language: English - Date: 2009-07-14 19:09:50
779Hardware description languages / Logic design / Altera / Semiconductor intellectual property core / VHDL / Verilog / SNOW / Application-specific integrated circuit / Keystream / Electronic engineering / Stream ciphers / Digital electronics

SNOW3G1 Ultra-Compact Snow 3G Cipher Core www.ipcores.com General Description

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Source URL: ipcores.com

Language: English - Date: 2012-03-19 23:00:22
780Semiconductor device fabrication / Electromagnetism / Wafer testing / MOSFET / Ring oscillator / Very-large-scale integration / Wafer / Process corners / Application-specific integrated circuit / Electronic engineering / Integrated circuits / Electronics

Design Dependent Process Monitoring for Back-end Manufacturing Cost Reduction Tuck-Boon Chan∗ , Aashish Pant∗ , Lerong Cheng† , Puneet Gupta∗ {tuckie,apant,puneet}@ee.ucla.edu, [removed], ∗ Depa

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Source URL: nanocad.ee.ucla.edu

Language: English - Date: 2010-09-27 14:41:05
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